Metrology Lab

Zeiss Contura G2 (x2)

Coordinate Measuring Machine

  • One in High-Precision 5-Axis Machining Lab
  • One in Metrology Lab
  • RDS articulating probe head
  • Calypso software with "curve"
  • 1.8 micron volumetric accuracy
  • 27” x 27” x 23” work envelope
Zeiss CMM
Zeiss Trained CMM Opperators

RAM Optical Sprint 300

Optical Measuring Machine

  • Programmable, non-contacting, visual measurement
  • 0.5 micron XYZ axis scales
  • 4.3 micron XY accuracy
  • 12” x 12” work envelope
Optical RAM Measurment
Non-Contact Visual Measurment

Zygo GPI XP

Topographic Laser Interferometer

  • Surface figure measurements to λ/20
  • 4” aperture with 6” beam-expander
  • MetroPro software system
Topographic Laser Interferometer
Topographic Laser Interferometer

Filmetrics Profilm3D

Optical Surface Profiler

  • Measurements of surface roughness and topography
  • Sub-nanometer vertical resolution
  • Vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI)
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Keyence IM-6225

Image Dimension Measurement

  • Automatic recognition of position and origin
  • Performs over 100 measurements simultaneously
  • Field of view: Ø100 × L200mm
  • Repetition: +/-0.5μm
  • Accuracy: +/- 2μm
Image Dimension Measurement